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Hitachi High Technologies America, Inc.

Hitachi

HF-3300 300 kV FE TEM

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HF-3300
HF-3300 300 kV FE TEM

Electron Microscope and Focused Ion Beam Contact Form
  • Electron source: Cold field emission electron source
  • Accelerating voltage: Max 300 kV
  • Resolution: 0.10 nm (lattice), 0.19 nm (point-to-point)
  • Magnification: 200x - 1,500,000x